Analysis of high purity arsenic by spark-source mass spectrometry (CAT#: STEM-ST-0279-LJX)

Introduction

Very low (μg kg−1 concentrations of most elemental impurities are determined in an arsenic matrix by spark-source mass spectrometry when working with a cut ion-sensitive plate. The mass spectrum of arsenic is relatively simple and the lines for almost all analytically important ions are interference free, at the mass resolution used (ca. 4000). In order to have semi-quantitative results at least, one element should be accurately determined by an independent technique, such as atomic absorption spectrometry. The measurements are then semi-quantitative.