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Andor Technology iKon-M PV Inspector Series Back Illuminated CCD, Deep Depletion with fringe Microscope Camera, Andor (CAT#: STEM-M-1335-LGZ)

Highlights

1. Extended Range Dual AR Option: Advanced UV-NIR Broadband Backlight QE.
2. TE cooling to -100 °C: the key to eliminating dark current.
3. Stripe suppression technology: NIR measurements are greatly reduced (BR-DD and BEX2-DD sensor types).

Cat Number: STEM-M-1335-LGZ

Application: To offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection.

Model: iKon-M PV

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Description

The manufacturer of Andor Technology iKon-M PV Inspector Series Back Illuminated CCD, Deep Depletion with fringe Microscope Camera is Andor. Model is iKon-M PV. Andor's iKon-M 934 series cameras are designed to provide the ultimate in high sensitivity, low noise performance, ideal for demanding imaging applications. These high-resolution 1024 x 1024 CCD cameras boast up to 95% QEmax, high dynamic range, 13 μm pixels and extremely low readout noise. The "Deep Depletion" sensor option provides the ultimate in performance for NIR applications, and the new dual AR coating significantly extends QE performance into the UV/Vis spectral region, enabling the widest possible spectral coverage in one sensor. The fringe suppression technique radically reduces scaling effects in the near infrared. Fast vertical displacement combined with fast kinetic acquisition modes, comprehensive trigger modes and custom coated wedge window options make the deep Depletion model ideal for the NIR.

Specification

Condition: used
Active pixels: 1024 x 1024
Sensor size: 13.3 x 13.3 mm
Pixel size (W x H): 13 μm x 13 μm
Active area pixel well depth: 100,000 e- (130,000 e- for BR-DD and BEX2-DD models)
Pixel readout rates (MHz): 5, 3, 1, 0.05
Read noise: 2.9 e-
Maximum cooling: -100 °C
Frame rate: 4.4 fps (full frame)
System window type: UV-grade fused silica, ‘Broadband VUV-NIR’, wedged
Interface: USB 2.0

Features

1. Extended Range Dual AR Option: Advanced UV-NIR Broadband Backlight QE.
2. TE cooling to -100 °C: the key to eliminating dark current.
3. Stripe suppression technology: NIR measurements are greatly reduced (BR-DD and BEX2-DD sensor types).
4. Up to 5 MHz pixel readout: High frame rate can be achieved.
5. Ultra-low noise readout: Smart low-noise electronics provide the most "silent" system noise performance available.
6. UltraVac: Year after year, essential for continued vacuum integrity and maintaining unmatched cooling and QE performance.
7. 13 × 13 μm pixel size: the best balance of dynamic range and resolution.
8. Integrated shutter: c-type shutter is standard. Off when reading to avoid vertical smears.
9. Cropped sensor mode: dedicated acquisition mode, continuous imaging, the fastest possible temporal resolution.
10. Enhanced Baseline Clamp: Quantitative Precision of Dynamic Measurements.
11. USB 2.0 connection: Simple plug and play connection.
12. Integrated in EPICS: The platform is fully integrated into the EPICS control software.

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