Atomic Force Microscope alpha300 A, WITec GmbH (CAT#: STEM-LE-2002-LC)

The Atomic Force Microscope alpha300 A integrates the AFM system with a scientific-grade optical microscope, enabling excellent optical access and high-resolution sample measurement. A special AFM objective lens is included to simultaneously observe the cantilever and the sample, thus providing precise cantilever positioning and quick alignment. The user-friendliness and versatility of the composite system can benefit a variety of scientific work.

Operating Mode(s):Contact Mode or Lateral Force, Pulsed Force, AC-Mode or Phase Imaging, Magnetic Force, Nanolithography or Nanomanipulation
Scan Range:100 x 100 x 20 um
Vibration Isolation:Integrated Active Vibration Isolation System
Detector(s):Segmented Photodiode

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