Scanning Electron Microscope

Scanning electron microscope (SEM) is a type of electron microscope, designed for directly studying the surfaces of solid objects, that utilizes a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. They are easy to operate and have user-friendly interfaces. They are used in a variety of industrial applications to analyze surfaces of solid objects. SEM is one of the common methods for imaging the microstructure and morphology of the materials.