Scanning Electron Microscopy-Energy Dispersive Spectroscopy (SEM-EDS)

Scanning Electron Microscopy-Energy Dispersive Spectroscopy (SEM-EDS) is a powerful analytical technique used for the characterization and imaging of materials at the nanoscale. SEM provides high-resolution images of a sample's surface morphology, while EDS complements this by offering elemental analysis. The SEM scans the sample's surface with a focused electron beam, causing interactions that emit various signals, including secondary electrons and characteristic X-rays. EDS detects and measures the energy of these X-rays to identify the elements present. This technique is widely used in materials science, geology, biology, and more to investigate the composition and structure of diverse specimens, providing valuable insights for research, quality control, and failure analysis.