Conductive AFM Probes, HQ:NSC19/Cr-Au, 65 kHz (0.5 N/m), MikroMasch (CAT#: STEM-M-0088-LKN)

Cat Number: STEM-M-0088-LKN

Application: Cantilevers of the 19 series combine high resonance frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in tapping mode. They are compatible with Bruker ScanAsyst ® PeakForce Tapping™*. The cantilevers may also be useful in LFM due to their high sensitivity to the lateral forces.

Model: HQ:NSC19/Cr-Au

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Description Specification Features Related Products

Description

MikroMasch Conductive AFM Probes are ideal for imaging of electric properties of materials in ambient conditions. Though silicon is conducting in bulk due to the presence of the dopants, the surface of the probe is always coated by a thin (1 - 2 nm) native oxide film. That is why using the conductivity of Si probes for AFM measurements is only possible in UHV conditions after the film is removed.

Specification

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 35 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Gold
Detector coating: Gold

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