EDX-7000 Energy Dispersive X-ray Fluorescence Spectrometers, Shimadzu (CAT#: STEM-LE-1197-LC)

EDX-7000/8000 system's latest technology semiconductor detector (SDD) provides high fluorescence X-ray count per unit time. This enables accurate high-resolution analysis while increasing throughput, enabling researchers and laboratories to increase their productivity without compromising accuracy. In addition, because it is electronically cooled, SDD does not require liquid nitrogen. This reduces operating costs and maintenance requirements. When combined with optimized optics and five main filters, the EDX-7000/8000 spectrometer can achieve unprecedented sensitivity and energy resolution.

Detector(s):SDD detector
Principle:Energy Dispersive X-ray Fluorescence
Sample Type:Electrical/electronic materials, Ceramics, Oil and petrochemicals, Chemicals, Soil, Pharmaceuticals, Food
Element Range:Na to U, C to U
Analysis Diameter:1, 3, 5, and 10 mm

Measuring range is 11Na to 92U (EDX-7000) and 6C to 92U (EDX-8000)
Five main filters – highly sensitive analysis of trace elements
Sample observation camera
Large sample chamber is able to accommodate almost any type of sample

EDX-LE Energy Dispersive X-ray Fluorescence Spectrometer, XRF-1800 X-Ray Fluorescence Spectrometer