General Purpose AFM Probes, HQ:CSC37/No Al, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0125-LKN)

MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm

Conductive AFM Probes, HQ:CSC37/Cr-Au, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0126-LKN)
Conductive AFM Probes, HQ:CSC37/Pt, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0127-LKN)