General Purpose AFM Probes, HQ:NSC14/Al BS, 160 kHz (5 N/m), MikroMasch (CAT#: STEM-M-0079-LKN)

Cat Number: STEM-M-0079-LKN

Application: Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

Model: HQ:NSC14/Al BS

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Description Specification Features Related Products

Description

MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

Specification

Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Aluminum

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