High-Resolution 3D Surface Analysis Service Based on FEI Quanta 3D FIB-SEM

STEMart offers High-Resolution 3D Surface Analysis Services utilizing the powerful FEI Quanta 3D FIB-SEM system. This advanced instrument enables detailed imaging and surface analysis of materials, combining both Focused Ion Beam (FIB) milling and Scanning Electron Microscopy (SEM) to deliver unparalleled accuracy and resolution. With our state-of-the-art facilities, we provide precise surface analysis solutions for a wide range of applications, including material science, semiconductor industries, and biological research.

The FEI Quanta 3D FIB-SEM operates by using a focused ion beam to mill the surface of the sample while the electron beam captures high-resolution images. This process allows for accurate 3D imaging of surface structures, providing insights into the morphology, composition, and mechanical properties of the material at a nanoscale level. The dual-beam system ensures superior precision in both imaging and surface modification, making it an ideal tool for high-resolution 3D surface analysis.

Leveraging our expertise and advanced equipment, STEMart offers comprehensive 3D surface analysis services. Whether you need to investigate material defects, analyze coatings, or study nanostructures, our services are designed to deliver precise, high-quality data to meet the specific needs of your project.

What We Offer

• Cross-Sectional Analysis of Coatings and Layers

FIB-SEM capabilities allow precise cross-sectional imaging of layered materials, enabling detailed analysis of coatings, thin films, and interfaces.

• Unparalleled Resolution

The FEI Quanta 3D FIB-SEM delivers exceptional resolution for detailed 3D surface analysis of complex materials and biological samples.

• Expertise in Material Science and Biology

Our team has extensive experience across a wide range of disciplines, providing tailored solutions for both material and biological research needs.

• Versatile Applications

Our 3D surface analysis services are suited for a variety of applications, from failure analysis to nanostructure research and more.

• Advanced Imaging Capabilities

Our FIB-SEM system allows for simultaneous surface imaging and modification, offering precise, high-quality results.

Why Choose Us

• Unparalleled Resolution

The FEI Quanta 3D FIB-SEM delivers exceptional resolution for detailed 3D surface analysis of complex materials and biological samples.

• Versatile Applications

Our 3D surface analysis services are suited for a variety of applications, from failure analysis to nanostructure research and more.

• Advanced Imaging Capabilities

Our FIB-SEM system allows for simultaneous surface imaging and modification, offering precise, high-quality results.

Our Equipment

FEI Quanta 3D FIB-SEM

The FEI Quanta 3D Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) is a versatile dual-beam system designed for high-resolution 3D imaging and surface analysis. Equipped with a focused ion beam for milling and an electron beam for imaging, this instrument enables precise cross-sectional analysis, material characterization, and nanostructure visualization. Its ability to handle a wide range of materials and its high-resolution capabilities make it an essential tool for advanced research in materials science, semiconductors, and life sciences.

STEMart provides high-quality advanced microscopy services tailored to meet the specific needs of our clients. Our experienced specialists use advanced equipment and follow strict quality control measures to ensure accurate and reliable results. Contact us to learn more about our advanced microscopy services and how we can help you achieve your research goals.