High Resolution AFM Probes, HI'RES-C15/CR-AU, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0067-LKN)

MikroMasch Hi'RES probes make higher resolution, sub-nanometer imaging possible. The Hi'Res probes allow for more accurate measurement of extremely narrow features such as pores, trenches, and sharp edges, along with accurate measurement of sub-nanometer surface roughness. In addition, these probes are also good for imaging soft, fragile and near-liquid samples as the tip-sample attraction force is significantly reduced due to the unsurpassed subnanometer tip radius. High-resolution probes are recommended for scanning small areas below 250 nm at 512 sampling points. Lateral resolution below 1 nm is attainable.

Typical spike radius: 1 nm
Spike height: 100 - 200 nm
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Gold

General Purpose AFM Probes, HQ:NSC15/Al BS, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0068-LKN)
General Purpose AFM Probes, HQ:NSC15/No Al, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0069-LKN)