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Inductively Coupled Plasma Mass Spectrometer, Model STEM-S-0063-CJ, DRAWELL (CAT#: STEM-S-0063-CJ)

Highlights

The surface width of elements that can be measured can reach more than 80 elements.
Simultaneous determination of multiple elements, including isotope analysis and speciation analysis of metal elements in organic matter.
High sensitivity and low detection limit. Trace elements in ppb and below concentrations can be measured.

Cat Number: STEM-S-0063-CJ

Application: Used for analyzing inorganic elements

Model: STEM-S-0063-CJ

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Description

The ICP-MS method has the advantages of simple sample preparation and injection technology, fast mass scanning speed, short operating cycle, and less interference to the ion information provided. For most elements, it has extremely low detection limits and is recognized as the most ideal method for analyzing inorganic elements. It can measure most of the periodic table of elements, with extremely low detection limit, extremely wide dynamic range, simple circuit, less interference, high precision, and fast speed, and can provide isotope analysis.

Features

The surface width of elements that can be measured can reach more than 80 elements.
Simultaneous determination of multiple elements, including isotope analysis and speciation analysis of metal elements in organic matter.
High sensitivity and low detection limit. Trace elements in ppb and below concentrations can be measured.
Good selectivity and less spectral line interference.
Wide dynamic linear range: up to 8 orders of magnitude
The sample is injected under atmospheric pressure, which is convenient for technical combination with other samples
Simultaneous and rapid analysis of multiple elements can be performed, and the isotope dilution method can be combined with a variety of separation techniques and sampling methods and can be adapted to trace or ultra-trace element analysis in complex systems

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