L79/ HCS Hall Effect Analysis / Hall Constant Measurement, Linseis Inc (CAT#: STEM-LE-0256-LC)

The L79/HCS System is designed for the measurement of mobility, resistivity, charge carrier concentration and hall coefficient to characterize semiconductor devices. The roughed desktop setup provides different sample racks for a variety of geometric shapes and temperature requirements. An opional low-temperature (LN2) accessory and high-temperature versions up to 800°C ensure coverage of all applications. Different permanent magnets and electromagnets can provide fixed or variable magnetic fields up to several Tesla.

Temperature Range: From LN2 up to 800°C in different configurations

Heat Flow Meter - Thermal Conductivity Testing, LFA 500 (Thermal Conductivity / Diffusivity), TF-LFA LaserFlash for Thin Films - Time Domain ThermoReflectance (TDTR), Transient Hot Bridge (THB) Thermal Conductivity Meter