Long Scanning AFM Probes, HQ:NSC15/Hard/Al BS, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0071-LKN)

Cat Number: STEM-M-0071-LKN

Application: Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also good for non-contact AFM.

Model: HQ:NSC15/Hard/Al BS

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Description Specification Features Related Products

Description

MikroMasch Long Scanning AFM Probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Specification

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 20 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Hard Diamond-Like-Carbon
Detector coating: Aluminum

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