MAP3D-25 Scan Profilometer, A.P.E. Research (CAT#: STEM-AIAE-0058-LKN)

A.P.E. Research MAP3D-25 Scan Profilometer is a semi-automatic instrument which gives profile data of a sample detecting the vertical detection of a stylus in contact with the sample which is moved horizontally across the sample surface.

Measuring method: Skid measurement
Measuring range Z-axis: Upto1mm
Type of sensor: Capacitive or laser deflection type sensor
Measuring range X Y: 25 mm-axis
Profiles: 1D; 2D; 3D
Evaluation parameter: Wide range of Roughness parameters, Waviness parameters and Dimension parameters
Sampling length (L): 25 mm
Sample size: Can accommodate samples up to 200x200 mm
Arbitrary length: 0.1-25mm
Color camera: 45° front view with white light LED sample ilumination
Low force setup: Setup to apply low forces down to 50 nN
Vibration isolation: Different suitable solution are available on demand