N-SIM E Super-Resolution Microscope, Nikon Instruments (CAT#: STEM-LE-0651-LC)

With the help of structured illumination microscope (SIM) technology, the new N-SIM E Super-Resolution Microscope achieves twice the spatial resolution (approximately 115 nm) of traditional optical microscopes. N-SIM E is a streamlined and affordable super-resolution system that only supports the necessary, commonly used excitation wavelengths and imaging modes, making it an obvious choice for a single laboratory.

Type:Inverted Microscopes
Resolution:115 nm (Lateral XY), 269 nm (Axial Z)
Wavelength(s):488nm / 561nm / 640nm

N-SIM Super-Resolution Microscope, N-STORM 4.0 Super-Resolution Microscope, N-STORM Super-Resolution Microscope