Non-Destructive Sample Analysis Service Based on FEI Quanta 650 FEG ESEM

STEMart offers advanced Non-Destructive Sample Analysis Services using the FEI Quanta 650 FEG Environmental Scanning Electron Microscope (ESEM). This instrument is designed for high-resolution imaging of samples in their natural, uncoated state, allowing for non-destructive analysis of various materials, including biological tissues, polymers, and delicate materials. The Quanta 650 FEG ESEM provides exceptional versatility and precision, ensuring accurate and reliable results for a wide range of applications in materials science, life sciences, and industrial research.

The FEI Quanta 650 FEG ESEM utilizes a field emission electron gun and operates under environmental conditions, eliminating the need for conventional sample preparation techniques like coating or dehydration. This technology allows for in situ imaging of hydrated, outgassed, and heat-sensitive samples. The system also offers variable pressure mode, which helps reduce charging effects in non-conductive materials, making it ideal for analyzing samples that cannot withstand traditional high-vacuum conditions.

Leveraging our FEI Quanta 650 FEG ESEM, STEMart provides comprehensive non-destructive analysis services for a variety of materials and industries. Whether you are investigating biological specimens or performing industrial material inspections, our expertise ensures precise and non-invasive analysis tailored to your project needs.

What We Offer

• Surface Morphology Analysis

High-resolution imaging of sample surfaces to analyze structure, texture, and topographical features, preserving the natural state of the sample.

• In Situ Hydrated Sample Imaging

Visualize hydrated samples without the need for dehydration or coating, allowing for more accurate analysis of biological specimens and soft materials.

• Elemental Mapping with EDS

Combine ESEM imaging with energy-dispersive X-ray spectroscopy (EDS) to obtain elemental composition and distribution data without damaging the sample.

• Failure Analysis and Defect Detection

Perform in-depth investigations into material defects, cracks, and failures in metals, polymers, and composites using non-destructive imaging techniques.

• Temperature-Controlled Imaging

Analyze temperature-sensitive materials under varying environmental conditions using the system's built-in temperature control features, ensuring precise data collection.

Why Choose Us

• In-Depth Elemental Analysis

Integrated EDS provides detailed elemental mapping and composition analysis, enabling a comprehensive understanding of material properties.

• Flexible Imaging Conditions

The ESEM’s variable pressure mode enables imaging of non-conductive and delicate samples without coating, reducing the risk of sample alteration.

• Expert Guidance and Support

Our team of microscopy specialists is dedicated to providing expert guidance and support throughout your project, ensuring accurate and relevant data acquisition.

• Customizable Solutions for Diverse Applications

We offer tailored imaging and analysis solutions to meet the unique needs of various industries, including materials science, electronics, and life sciences.

Our Equipment

FEI Quanta 650 FEG ESEM

The FEI Quanta 650 FEG ESEM is equipped with a field emission gun for high-resolution imaging and operates under environmental conditions, allowing for non-destructive analysis of hydrated and heat-sensitive samples. It features variable pressure mode, integrated energy-dispersive X-ray spectroscopy (EDS) for elemental mapping, and advanced temperature control for in situ imaging under various conditions.

STEMart provides high-quality advanced microscopy services tailored to meet the specific needs of our clients. Our experienced specialists use advanced equipment and follow strict quality control measures to ensure accurate and reliable results. Contact us to learn more about our advanced microscopy services and how we can help you achieve your research goals.