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SGW® X-4A Micro Melting Point Apparatus, 220V±22V, 50Hz±1Hz, Shanghai INESA Physico-Optical Instrument CompanyLimited (CAT#: STEM-DTE-3016-LGZ)

Highlights

Determine the melting point of a substance. The instrument adopts the microscope observation method, which can be measured by the capillary method or the slide-coverslip method (hot stage method).

Cat Number: STEM-DTE-3016-LGZ

Application: For the determination of crystalline organic compounds such as pharmaceuticals, chemicals, textiles, fuels, spices, etc.

Model: SGW® X-4A

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Description

Determine the melting point of a substance. The instrument adopts the microscope observation method, which can be measured by the capillary method or the slide-coverslip method (hot stage method).

Specification

Measuring range: room temperature~320 °C
Measurement method: Visual
Measurement mode: capillary method, hot stage method
Minimum indication: 0.1°C
Repeatability: ≤200°C±1°C, >200°C ±2°C
Observation method: Monocular microscope
Magnifying glass magnification: 40×
Power supply: 220V±22V, 50Hz±1Hz
Instrument size: 215×140×395mm
Instrument net weight: 3.6kg

Features

Determine the melting point of a substance. The instrument adopts the microscope observation method, which can be measured by the capillary method or the slide-coverslip method (hot stage method).

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