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Study of Size Dependence of Optical Properties and Internal Structure of Plasma Grown Carbonaceous Nanoparticles by Rayleigh-Mie Scattering (CAT#: STEM-ST-0077-YJL)

Introduction

Plasma based techniques are considered as one of the most important tools for the development of advanced technologies. One of the problems in plasma technologies, especially in the field of thin film processing and microprocessor fabrication, is the formation of nanoparticles. These nanoparticles are formed spontaneously during the plasma process and can grow rapidly up to a size of several hundreds of nanometers. A direct measurement of the optical properties of carbonaceous nanoparticles as a function of size is of large interest, in particular, at small radii.




Principle

Mie scattering is defined as the type of scattering in which the diameter of the particle is the same or more than the wavelength of the radiation. Mie scattering gives a generalized solution for a system where a scattering of light takes place by a homogenous spherical medium. And this medium should have a refractive index different from that of the medium through which the light is traversing.
Unlike Rayleigh scattering, Mie scattering is not a physically independent phenomenon rather, it is a solution to Maxwell's equations for situations where the phase of the incident angle can change within the dimension of the scattering particles. Mie scattering is more commonly known as Mie solution, and it is named after Gustav Mie, a German physicist.
Mie scattering is also known as aerosol particle scattering, takes place in the atmosphere below 1,500 feet. In Mie scattering, the diameter of the spherical particles through which the light is scattered is approximately equal to the wavelength.

Applications

Mie scattering occurs in a variety of applications, including atmospheric science, cancer detection and treatment, metamaterials, and parasitology. Another application is the characterization of particles by optical scattering measurements.

Procedure

1. Sample preparation
2. Measurement by scattering detection instrument
3. Data analysis

Materials

Mie scattering measurement system
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