Surface Analysis Service Based on SIMS

STEMart offers specialized Surface Analysis Services using Secondary Ion Mass Spectrometry (SIMS), a leading-edge technique for analyzing the composition of surfaces and thin films at the molecular level. Our laboratory employs SIMS to accurately characterize material surfaces, offering unparalleled sensitivity and depth profiling capabilities. This technology is ideal for a variety of industries, including electronics, coatings, semiconductors, and biomaterials, where understanding surface chemistry and structure is crucial to product performance and quality.

SIMS operates by bombarding a material's surface with a focused ion beam, which causes the ejection of secondary ions from the surface. These ions are then analyzed based on their mass-to-charge ratios, allowing for precise chemical composition mapping at nanometer depths. This technique is particularly useful for detecting trace elements and impurities, as well as providing detailed molecular and isotopic information. SIMS is widely applied in materials science, semiconductor manufacturing, and quality control, where surface properties significantly affect product functionality.

Leveraging the capabilities of SIMS, STEMart offers a comprehensive range of surface analysis services designed to meet your research, development, and quality assurance needs. Our services provide accurate and detailed insights into surface composition and structure, ensuring that your products perform as expected under varying conditions.

What We Offer

• Elemental Depth Profiling

We provide detailed elemental depth profiles of surfaces and thin films, offering insights into layer composition and detecting impurities at nanometer scales.

• Isotopic Analysis

Our service includes precise isotopic ratio measurements, supporting research into material origin, purity, and processing.

• Surface Contamination Detection

Using SIMS, we detect and analyze surface contaminants, ensuring that your products meet stringent cleanliness and quality standards.

• Molecular Surface Mapping

We offer molecular surface mapping to visualize the distribution of specific compounds across surfaces, helping in material design and optimization.

Why Choose Us

• High Sensitivity and Depth Resolution

Our SIMS system provides unmatched sensitivity and depth resolution, enabling accurate analysis of surface layers down to nanometer scales.

• Comprehensive Surface Insights

We offer a wide range of services to deliver in-depth data on surface composition, contamination, and molecular structure.

• Fast Turnaround and Reliable Data

Our efficient workflows ensure fast turnaround times and reliable results, supporting your product development and quality assurance processes.

Our Equipment

Secondary Ion Mass Spectrometry (SIMS)

This system provides high-resolution depth profiling and surface composition analysis by bombarding surfaces with an ion beam and analyzing ejected secondary ions.

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

An advanced variant of SIMS, TOF-SIMS offers enhanced resolution and sensitivity, particularly useful for analyzing complex surfaces and molecular distributions.

Scanning Electron Microscopy (SEM)

SEM complements our SIMS services by providing detailed imaging of surface morphology, helping to correlate surface features with compositional data.

STEMart provides high-quality mass spectrometry services tailored to meet the specific needs of our clients. Our experienced specialists use advanced equipment and follow strict quality control measures to ensure accurate and reliable results. Contact us to learn more about our mass spectrometry services and how we can help you achieve your research goals.