Ultrastructural characterizations of DNA nanotubes by scanning tunneling and atomic force microscopes (CAT#: STEM-MIT-0320-LJX)

The basic principle of scanning tunneling microscope (STM) is to use the tunneling effect in quantum theory. An extremely fine probe of atomic linearity and the surface of the substance under study are used as two electrodes. When the sample is very close to the tip of the needle (usually less than 1nm), electrons flow through the barrier between the two electrodes to the other electrode under the action of an applied electric field. This phenomenon is known as tunneling effect.
Atomic force microscope (AFM) is a new type of surface analysis instrument based on the principles of physics and imaging through the interaction of scanning probe and sample surface atoms. It belongs to the third generation of microscopes after optical microscopes and electron microscopes.
AFM usually uses a sharp probe to scan the sample, which is fixed on a microcantilever that is extremely sensitive to the surface force between the probe and the sample. The deflection of the cantilever under force can cause the laser beam emitted by the laser source to shift after being reflected by the cantilever. The detector receives reflected light, and finally receives signals that are collected, processed, and formed into surface morphology images of the sample through a computer system.

Studing the structure of the sample surface by high resolution imaging
Manipulating individual atoms to form nanostructures

1. Sampling
2. Preparation of slices (Select according to the specific experimental situation)
3. Staining (Select according to the specific experimental situation)
4. Observation

• Sample Type:
DNA nanotubes

Operate in strict accordance with the operating procedures, and shall not arbitrarily change the operating procedures