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1. Various image processing methods: image enhancement, image overlay, local extraction, fixed magnification, contrast, brightness adjustment, particle positioning, automatic segmentation and other dozens of functions.
2. Basic measurement of dozens of geometric parameters such as roundness, curve, perimeter, area, diameter, etc.
3. The distribution map can be drawn in a linear or non-linear statistical way directly according to various parameters such as particle size, particle size, area and shape.
Cat Number: STEM-AIAE-3246-LGZ
Application: Used for particle image analysis.
Model: WKL-708