X-Ray Diffractometer (XRD), Model STEM-S-0033-CJ, DRAWELL (CAT#: STEM-S-0033-CJ)

The vast majority of solid materials are crystals or quasicrystals, which can produce characteristic diffraction of X-rays. By recording these diffractions in a proper way, different patterns of X-ray diffraction patterns can be obtained. It can be said that the X-ray diffraction pattern of each substance carries a wealth of information about the structure of the substance. By analyzing these patterns, the structure of the sample can be studied and determined. “Structure” here includes the elemental composition, composition, structure, organization, structure, state, and other meanings of material materials. With the continuous advancement of technology, XRD has now been widely used in many fields such as materials science, physics, chemistry, and chemical engineering.

A wide range of applications, meeting the needs of scholars and researchers in various fields.
High-precision diffraction angle measurement system to obtain more accurate measurement results.
Highly stable X-ray generator control system to obtain more stable repeat measurement accuracy.
Non-destructive, non-destructive analysis method.
Easy to prepare samples.

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