ZSX 400 Wavelength Dispersive X-ray Fluorescence Spectrometer, Rigaku (CAT#: STEM-LE-1108-LC)

ZSX 400 Wavelength Dispersive X-ray Fluorescence Spectrometer is specifically designed to handle very large and/or heavy samples such as sputtering targets, disk or multilayer film metrology. The system can accept samples with a maximum diameter of 400 mm, a thickness of 50 mm, and a weight of 30 kg.

Detector(s):Heavy element detector - Scintillation counter (SC), Light element detector - Flow proportional counter (F-PC), Attenuator - In-out automatic exchanger (1/10)
Principle:Wavelength Dispersive X-ray Fluorescence (WDXRF)
X-Ray Tube:End window, Rh-anode, 3kW or 4 kW, 60kV
Analysis Diameter:30 to 0.5 mm

Large sample analysis
Sample adapter system
Measurement spot
Mapping capability
Sample view camera (option)
General purpose
Diffraction interference rejection (option)
Compliance with industry standards
Small footprint

Mini-Z Sulfur Wavelength Dispersive X-ray Fluorescence Sulfur Analyzer, ZSX Primus II XRF, ZSX Primus IV Tube-above WDXRF Spectrometer, ZSX Primus XRF