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Determination of the Micelle Concentration of Surfactants by Resonance Rayleigh Scattering Method (CAT#: STEM-ST-0004-YJL)

Introduction

Critical micelle concentration (CMC) is the concentration in which a surfactant starts to aggregate and form micelle, and it is one of the most important physical parameters of surfactants. The properties of a surfactant vary markedly when its concentration is higher or lower than its CMC, and the studies and industrial applications of a surfactant are always based on the value of its CMC. The usually called CMC actually refers to the first critical micelle concentration (FCMC) of a surfactant. Critical premicelle concentration (CPMC) can be defined as the onset of premicellar aggregate for a surfactant at the concentration far below its FCMC, which usually is lower by about two or three orders of magnitude than its FCMC. When the concentration of a surfactant is higher than its FCMC, spherical micelles can aggregate to form ellipsoidal, oblatoid or lamellar micelles and the concentration was called second critical micelle concentration (SCMC).




Principle

The scattering of waves by small impurities (compared to the wavelength) is known as Rayleigh scattering, named after the British physicist who in 1871 first described this phenomenon quantitatively. Rayleigh scattering is a universal mechanism applicable to several contexts, from light scattering (damping of signals in optical fibres) to sound waves in solids and quantum-mechanical wavefunctions of electrons in disordered solids. Mathematically, Rayleigh scattering predicts a mean free path of the wave that varies with wavelength λ, proportional to 1/λ4.

Applications

Rayleigh scattering is used to analyze the properties of the Earth's atmosphere and used in optical communication systems. It is is applicable to scattering of UV and visible radiation by air molecules, infra-red radiation by small aerosols, and microwave radiation by cloud and rain drops.

Procedure

1. Sample preparation
2. Measurement by scattering detection instrument
3. Data analysis

Materials

Rayleigh scattering measurement system
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