We use cookies to understand how you use our site and to improve the overall user experience. This includes personalizing content and advertising. Read our Privacy Policy
Unlock Exclusive Discounts & Flash Sales! Click Here to Join the Deals on Every Wednesday!
Dynamic secondary ion mass spectrometry (D-SIMS) technology is a very sensitive surface analysis technology that uses primary ions to excite a sample surface and produce extremely small amounts of secondary ions. Then, the type of element is determined according to the mass of the secondary ion. D-SIMS can provide elemental structure information on surfaces, films, interfaces, and even 3D samples. The technology has the characteristics of small analysis area, shallow analysis depth and high detection limit. D-SIMS is commonly used for surface analysis of metals, glass, ceramics, films and other materials.
We use cookies to understand how you use our site and to improve the overall user experience. This includes personalizing content and advertising. Read our Privacy Policy