Surface Roughness Measurement Service Based on Bruker Dimension Icon AFM

STEMart provides precise Surface Roughness Measurement Services using the Bruker Dimension Icon Atomic Force Microscope (AFM). Our lab leverages the advanced capabilities of the Bruker Dimension Icon to deliver high-resolution surface measurements across a variety of materials and applications. With exceptional accuracy and a wide range of analysis modes, this instrument ensures detailed characterization of surface features at the nanoscale, enabling researchers to make informed decisions about material properties.

The Bruker Dimension Icon AFM is known for its ability to generate accurate topographical maps of surfaces at sub-nanometer resolutions. This technology is widely used in various disciplines, including materials science, semiconductor research, and nanotechnology. Its high sensitivity and precision make it an essential tool for studying surface roughness, providing quantitative data that helps researchers assess the quality and performance of materials.

Leveraging our Bruker Dimension Icon AFM, STEMart offers a comprehensive range of surface roughness measurement services tailored to your specific needs. Whether you're analyzing industrial materials, conducting academic research, or evaluating product performance, our services provide precise surface data to support your goals.

What We Offer

• Nanoscale Surface Roughness Measurement

Obtain precise measurements of surface roughness at the nanometer scale, ideal for applications in materials science, semiconductors, and nanotechnology.

• 3D Surface Topography Analysis

Generate 3D topographical maps of surfaces with high-resolution imaging, enabling detailed characterization of micro- and nano-features.

• Quantitative Roughness Metrics

Receive detailed quantitative analysis of surface roughness, including parameters such as Ra, Rq, and Rt, for comprehensive surface characterization.

• Multi-Mode AFM Analysis

Explore various surface properties, such as mechanical properties and adhesion, using multiple AFM modes, including tapping and contact mode, alongside roughness analysis.

Why Choose Us

• High-Resolution AFM Imaging

Our Bruker Dimension Icon AFM offers sub-nanometer resolution, ensuring the most accurate surface roughness measurements available.

• Wide Range of Applications

We support surface roughness analysis for various industries, including electronics, materials science, and nanotechnology.

• Comprehensive Reporting

We deliver thorough reports that include surface roughness metrics, high-resolution images, and detailed 3D topographical data.

Our Equipment

Bruker Dimension Icon AFM

The Bruker Dimension Icon AFM is an industry-leading instrument known for its high resolution and precision in surface characterization. It allows for detailed topographical imaging and surface roughness measurement at the nanoscale, providing critical data for a wide range of applications in materials science, semiconductors, and nanotechnology. The system supports multiple modes of operation, ensuring versatility in capturing surface features.

STEMart provides high-quality advanced microscopy services tailored to meet the specific needs of our clients. Our experienced specialists use advanced equipment and follow strict quality control measures to ensure accurate and reliable results. Contact us to learn more about our advanced microscopy services and how we can help you achieve your research goals.