Elemental Analysis by X-Ray Fluorescence (XRF) (CAT#: STEM-EA-0209-ZJF)

Introduction

XRF can detect elements from B-U in concentrations from ppm to 100%. This technique can also be used to measure copper.
We provide fast quantitative and semi-quantitative analysis of elements in samples by XRF analysis. X-ray fluorescence (XRF) is a non-destructive technique that is used to measure film thickness and elemental composition of materials. Due to the use of X-rays to excite the sample, it is possible to achieve depths of analysis ranging from a few nanometers to several millimeters, depending on the material. Most materials can be accurately quantified by XRF by using appropriate reference standards, or fundamental parameters (FP) in the absence of standards.
There are two types of XRF systems available for service:
1. Wavelength dispersive spectrometers (WDXRF): Photons are separated by diffraction on a single crystal before detection. With WDXRF, there is a very good energy resolution, which results in fewer spectral overlaps and a lower background intensity.
2. Energy dispersive spectrometers (EDXRF): The detector allows the determination of the photon's energy when it is detected. With EDXRF, a higher signal throughput is possible, which allows for analysis or mapping of small areas.If you have any requirements or questions. Don't hesitate to contact us.

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Principle Applications Procedure Materials Notes Related Products

Principle

The phenomenon of X-ray fluorescence (XRF) occurs when a sample is exposed to energy-rich X-rays, and when these X-rays strike an atom (or molecule) in the sample, energy is absorbed by the atom. When the energy is high enough, a core electron is ejected from its atomic orbital. To fill the void left by the unoccupied orbital, an electron from an outer shell is dropped into the unoccupied orbital. An X-ray detector can detect this transition by detecting an X-ray with a fixed, characteristic energy. As with the energy required to eject a core electron, the energy emitted by a transition is characteristic of each element. The transition of an L shell electron dropping into the K shell is termed a Kα transition, while an M shell electron dropping into the K shell is a Kß transition. The X-ray beam can be very small, very intense, and can provide atomic information on the sub-micrometer scale when the energy source is a synchrotron, or when the X-rays are focused by an optic, such as a polycapillary.

Applications

Research in igneous, sedimentary, and metamorphic petrology, soil surveys, mining, cement production, ceramic and glass manufacturing, metallurgy, environmental studies, petroleum industry, geological studies, etc.

Procedure

1. Sample preparation
2. Instrument start-up
3. Dry run
4. Sample analysis with XRF
5. Shutdown, quality assurance and data output

Materials

• XRF system
• Sample material: including but not limited to powders, granules, films, pellets, beads, discs, filters, fibers, castings, glass, metals, ceramics, polymers, residues, minerals, polymers, catalysts, oils, deposits, metals.