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Elemental Mapping by Laser Induced Breakdown Spectroscopy (LIBS) (CAT#: STEM-EA-0211-ZJF)

Introduction

LIBS is a powerful and versatile chemical analysis technique that combines automated pulsed laser micro-sampling with optical emission spectrometry to characterize relative element abundances, and element distributions within solid samples. It is capable of mapping 2D and 3D micro-scale elemental distributions of any naturally occurring element down to the level of a part per million. There is no need to prepare samples prior to analysis, and data collection is indirect, making LIBS particularly suitable for materials that are sensitive to the atmosphere.
By measuring sample composition indirectly with the spectrometer, LIBS is particularly valuable for samples that are sensitive to the atmosphere, and it is currently being used by NASA's Mars rovers.
Service we provide based on LIBS:
• 2D Trace/major elemental mapping
• 3D Trace/major elemental depth profiling/mapping
• 2D/3D Mapping & Advanced Statistical Data Processing (PCA)
Our technical capabilities:
• Depth Profiling Resolution: >0.1 μm
• Spot Sizes: 40 – 200 μm
• Analysis Patterns: Spots, lines, rasters
• Sensitivity: 2 to 5 parts per million (ppmw)
If you have any requirements or questions. Don't hesitate to contact us.




Principle

In LIBS, a high-energy pulsed laser is used to remove material from the surface of a sample. The sample is placed on a motorized stage which moves in any pre-selected x, y, or z direction so that the fixed laser can scan over its surface. By using laser pulses, nanograms and picograms of material can be removed. The laser can be used to analyze a region between 20 and 200 micrometers in size, or a larger area using line patterns. It is also possible to profile depth using a fixed spot analysis.

Applications

Rapidly survey chemical composition of solid materials
Elemental distribution analysis and micron-scale mapping of trace elements
Depth profiling

Procedure

1. Sample preparation
2. Sample analysis by LIBS
3. Data output

Materials

• LIBS system
• Sample material: glass, optical displays, mining products – provenance, tracing, manufactured minerals and abrasives, ceramics, cements, sediments, solders (e.g. component micro-analysis), sample/near surface (> ~1-2 µm), metal alloys, heavy metal QC/contamination (e.g. soils, pharmaceuticals, medical), high purity materials, impurities in electronic components, dental ceramics and porcelains, forensic materials (e.g. hair, bone, ink), nuclear applications (e.g. Ga in nickel), thick films and substrates, rare earth dopants.
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