HC High Content Analysis System, Nikon Instruments (CAT#: STEM-LE-0669-LC)

The N-SIM super-resolution microscope system combines structural illumination microscope technology licensed by UCSF and is based on the world-renowned Eclipse Ti research inverted microscope and Nikon's legendary CFI Apo TIRF 100x oil objective lens, which can produce nearly twice the resolution of traditional optical microscopes. Rate (NA 1.49), developed using unique optical technology and manufacturing technology. N-SIM also has the fastest imaging capability in the industry, with a time resolution of 0.6 seconds/frame.

Type:Motorized inverted microscope ECLIPSE Ti-E
Illumination:Fluorescence, Phase contrast, DIC
Image Recording:Multichannel, Time lapse, Multidimensional imaging

Eclipse Ci-L Upright Microscope, Eclipse E200 POL Polarizing Microscope, Eclipse E200-LED Upright Microscope, Eclipse Ti Series Inverted Microscopes