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Measurement of thin film thermal conductivity using Lser Flash method (CAT#: STEM-PPA-0054-WXH)

Introduction

Thermal performance of thin films is crucial in many industries, ranging from battery and aerospace to the electronics industries. As a result, thermal characterization of thin films is important in developing new materials and optimizing device performance and reliability. As a key parameter of thermal characterization, thermal conductivity therefore is a consideration at all levels when thermal engineers design for optimum heat dissipation, bonding and homogeneity.




Principle

The laser flash analysis or laser flash method is used to measure thermal diffusivity of a variety of different materials. An energy pulse heats one side of a plane-parallel sample and the resulting time dependent temperature rise on the backside due to the energy input is detected. The higher the thermal diffusivity of the sample, the faster the energy reaches the backside.

Applications

Used to measure thermal diffusivity of a variety of different materials.

Procedure

The front surface of a plane-parallel sample is heated by a light pulse and the resulting temperature rise at the sample’s rear face is recorded as a function of time. The higher the thermal diffusivity, the faster the temperature rise reaches the rear face.

Materials

Light/Laser Flash Analyzers
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