The NANOHUNTER II Benchtop Total XRF Spectrometer can perform highly sensitive ultra-trace element analysis on liquids as low as parts-per-billion (ppb) concentrations.
Specification
Principle:Energy Dispersive X-ray Fluorescence X-Ray Tube:600 W Detector(s):SDD (Peltier thermo-electric cooling) Element Range:Na to U Sample Chamber:26 x 76 mm, max. 5 mm thickness
Features
Benchtop TXRF for ultra-trace analysis GI-XRF capability for thin film characterization Quantify to parts-per-billion (ppb) levels 600 W X-ray tube for fast measurements Silicon drift detector (SDD) 16 position autosampler High sensitivity for As, Se and Cd Perfect for nano-particle analysis