PPP-FMR Force Modulation Microscopy AFM Probe, Park Systems Inc (CAT#: STEM-LE-0863-LC)

The Pyrex-Nitride probe has a silicon nitride cantilever beam that has a very low force constant and integrates a sharp pyramidal oxide tip with a height of 3.5 µm. The tip is located 4µm behind the free end of the cantilever. This probe series has a support chip made of Pyrex. Two chip versions are available: DB series with rectangular/diving board cantilever and TR series with triangular cantilever. Both sides of the chip have the same cantilever. All cantilevers are stress compensated and have a 65 nm chrome/gold back coating to achieve high laser reflectivity.

Material:Pyrex-Nitride
Resonant Frequency:75 kHz
Force Constant:2.8 N/m
Tip Measurement:0.6 µm
Cantilever Length:100 to 200 µm