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High-speed two-dimensional (2D) semiconductor detectors can speed up data collection. The residual stress measurement time is 60 seconds (shorter in most cases).
The instrument is remotely controlled by a desktop PC equipped with Wi-Fi communication function.
The battery is powered by a replaceable battery. There is no need to prepare utilities on site, such as cooling water and electricity.
Cat Number: STEM-LE-1083-LC
Application: Stress analysis