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Study of Heavy Metals in Wild Edible Mushrooms by X-ray fluorescence spectrometry (XFS) (CAT#: STEM-ST-0233-WXH)

Introduction

Studies on metals in fungi have shown a correlation between fungal metal content and sources of metal pollution, such as smelters and road proximity. The fleshy sporocarps of macrofungi have a short lifetime (1-2 weeks), although the mycelium growing in soil may live for many years. Thus, fungal sporocarps are especially useful as a bioindicator, because their short life for leaching of metals or for deposition of pollution onto the sporocarps surface makes them appropriate for environmental contamination. However, the absorption rates between fungal species are not the same, and differences are also observed in the same species for different metals, making some species better indicators than others for some elements.




Principle

XRF describes the process where some high-energy radiation excites atoms by shooting out electrons from the innermost orbitals. When the atom relaxes, that is, when outer electrons fill inner shells, X-Ray fluorescence radiation is emitted.

Applications

XRF is widely used as a fast characterization tool in many analytical labs across the world, for applications as diverse as metallurgy, forensics, polymers, electronics, archaeology, environmental analysis, geology and mining.

Procedure

1. Primary X-rays knock out an electron from one of the orbitals surrounding the nucleus within an atom of the material.
2. A hole is produced in the orbital, resulting in a high energy, unstable configuration for the atom.
3. To restore equilibrium, an electron from a higher energy, outer orbital falls into the hole. Since this is a lower energy position, the excess energy is emitted in the form of fluorescent X-rays.
The energy difference between the expelled and replacement electrons is characteristic of the element atom in which the fluorescence process is occurring – thus, the energy of the emitted fluorescent X-ray is directly linked to a specific element being analyzed.

Materials

XRF spectrometer (including X-ray source, sample chamber, analysing crystal, detector and signal processing computer)
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