XGT-9000 Micro XRF Analytical Microscope, Element Range: Na (11) - U (92), HORIBA Scientific (CAT#: STEM-CA-0019-LKN)

Cat Number: STEM-CA-0019-LKN

Application: Analysis of Foreign Material in Films and Analysis of Hydrous Samples.

Model: XGT-9000

Description Specification Features Related Products

Description

XGT-9000 Micro XRF Analytical Microscope is manufactured by HORIBA Scientific. This product is used for high-speed analysis of foreign materials, through high-speed screening and imaging processing. In addition, high resolution X-ray beam can be used to analyze the elements contained in impurities in detail. This series of foreign material analysis can be completed by a single unit, up to tens of microns.

Specification

Detector(s): X-ray Fluorescence detector (LN2 Free detector (SDD)) and Transmission X-ray detector.
Principle: Energy dispersive X-ray fluorescence.
Element Range: Na (11) ~ U (92).
Dimensions: (WxDxH) 680 x 900 x 769 mm.

Other recommended products

EMIA-Step Carbon/Sulfur Analyzer, Measurement Range: Carbon: 0.0003 to 6.0% (m/m), Sulfur: 0.0004 to 1.0%(m/m), HORIBA Scientific (CAT#: STEM-CA-0020-LKN)
Fully Automatic Chemistry Analyzer NFAC-201, LABNICS EQUIPMENT LTD. (CAT#: STEM-AIAE-0054-LC)
Cell Disruption Vessel,Up to 600 mL, Parr Instrument Company (CAT#: STEM-LE-0877-LC)
TOPwave Sample Preparation System, 480 x 640 x 440 mm, Analytik Jena (CAT#: STEM-LE-1565-Y)
Semi-Automatic Chemistry Analyzers NSCA-101, Weight 7 kg, LABNICS EQUIPMENT Limited Company (CAT#: STEM-AIAE-3012-LGZ)
Fully Automatic Chemistry Analyzer NFAC-203, LABNICS EQUIPMENT LTD. (CAT#: STEM-AIAE-0056-LC)
GD-Profiler 2 Glow Discharge Spectrometer, Wavelength Range: 110 to 800 nm, HORIBA Scientific (CAT#: STEM-CA-0014-LKN)
LAB-X5000 Benchtop EDXRF Analyzer, Element Range: Na-U, Hitachi High-Tech Analytical Science America, Inc (CAT#: STEM-CA-0004-LKN)