Conductive AFM Probes, HQ:NSC16/Cr-Au, 190 kHz (45 N/m), MikroMasch (CAT#: STEM-M-0077-LKN)

Cat Number: STEM-M-0077-LKN

Application: The 16 series cantilevers with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM systems that have a low-frequency feedback loop. These cantilevers also fit SPMs that do not support probes with short lever arms.

Model: HQ:NSC16/Cr-Au

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Description Specification Features Related Products

Description

MikroMasch Conductive AFM Probes are ideal for imaging of electric properties of materials in ambient conditions. Though silicon is conducting in bulk due to the presence of the dopants, the surface of the probe is always coated by a thin (1 - 2 nm) native oxide film. That is why using the conductivity of Si probes for AFM measurements is only possible in UHV conditions after the film is removed.

Specification

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 35 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Gold
Detector coating: Gold

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