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Determination of the Wavelength-Dependent Refractive Index of Polystyrene Beads by Mie Scattering (CAT#: STEM-ST-0071-YJL)

Introduction

The real component of the refractive index of a material is important for modelling the light scattering of aerosol. In the atmosphere, it is especially critical in the evaluation of radiative forcing for modern climate change. An emerging issue in atmospheric science is the transportation and deposition of microplastics as they may pose serious risks to both human health and the environment. It is therefore useful to study the refractive index of one such plastic, polystyrene.Precise measurement of the temperature dependence of the refractive index of polystyrene beads is required for an accurate calibration of such instruments.




Principle

Mie scattering is defined as the type of scattering in which the diameter of the particle is the same or more than the wavelength of the radiation. Mie scattering gives a generalized solution for a system where a scattering of light takes place by a homogenous spherical medium. And this medium should have a refractive index different from that of the medium through which the light is traversing.
Unlike Rayleigh scattering, Mie scattering is not a physically independent phenomenon rather, it is a solution to Maxwell's equations for situations where the phase of the incident angle can change within the dimension of the scattering particles. Mie scattering is more commonly known as Mie solution, and it is named after Gustav Mie, a German physicist.
Mie scattering is also known as aerosol particle scattering, takes place in the atmosphere below 1,500 feet. In Mie scattering, the diameter of the spherical particles through which the light is scattered is approximately equal to the wavelength.

Applications

Mie scattering occurs in a variety of applications, including atmospheric science, cancer detection and treatment, metamaterials, and parasitology. Another application is the characterization of particles by optical scattering measurements.

Procedure

1. Sample preparation
2. Measurement by scattering detection instrument
3. Data analysis

Materials

Mie scattering measurement system
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