High Resolution AFM Probes, Hi'Res-C19/CR-AU, 65 kHz (0.5 N/m), MikroMasch (CAT#: STEM-M-0085-LKN)

Cat Number: STEM-M-0085-LKN

Application: Cantilevers of the 19 series combine high resonance frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in tapping mode. They are compatible with Bruker ScanAsyst ® PeakForce Tapping™*. The cantilevers may also be useful in LFM due to their high sensitivity to the lateral forces.

Model: Hi'Res-C19/CR-AU

Add to Cart

Description Specification Features Related Products

Description

MikroMasch Hi'RES probes make higher resolution, sub-nanometer imaging possible. The Hi'Res probes allow for more accurate measurement of extremely narrow features such as pores, trenches, and sharp edges, along with accurate measurement of sub-nanometer surface roughness. In addition, these probes are also good for imaging soft, fragile and near-liquid samples as the tip-sample attraction force is significantly reduced due to the unsurpassed subnanometer tip radius. High-resolution probes are recommended for scanning small areas below 250 nm at 512 sampling points. Lateral resolution below 1 nm is attainable.

Specification

Typical spike radius: 1 nm
Spike height: 100 - 200 nm
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Gold

Related Products

General Purpose AFM Probes, HQ:NSC19/Al BS, 65 kHz (0.5 N/m), MikroMasch (CAT#: STEM-M-0086-LKN)
General Purpose AFM Probes, HQ:NSC19/No Al, 65 kHz (0.5 N/m), MikroMasch (CAT#: STEM-M-0087-LKN)

Other recommended products

Conductive AFM Probes, HQ:CSC38/Cr-Au, 10 - 20 kHz (0.03 - 0.09 N/m), MikroMasch (CAT#: STEM-M-0133-LKN)
Test Structures TGXYZ02/NM (100 nm Step Height XYZ Calibration Grating), MikroMasch (CAT#: STEM-M-0149-LKN)
Long Scanning AFM Probes, HQ:NSC14/Hard/Al BS, 160 kHz (5 N/m), MikroMasch (CAT#: STEM-M-0082-LKN)
Conductive AFM Probes, HQ:NSC35/Pt, 150 - 300 kHz (5.4 - 16 N/m), MikroMasch (CAT#: STEM-M-0110-LKN)
Long Scanning AFM Probes, HQ:NSC16/Hard/Al BS, 190 kHz (45 N/m), MikroMasch (CAT#: STEM-M-0076-LKN)
General Purpose AFM Probes, HQ:CSC37/No Al, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0125-LKN)
General Purpose AFM Probes, HQ:CSC38/No Al, 10 - 20 kHz (0.03 - 0.09 N/m), MikroMasch (CAT#: STEM-M-0131-LKN)
Highly Ordered Pyrolytic Graphite ZYH (HOPG, 3.5° Mosaic Spread), 10 x 10 x 1 mm, 5 chip, MikroMasch (CAT#: STEM-M-0162-LKN)