Tipless AFM Probes, HQ:NSC36/tipless/No Al, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0121-LKN)

Cat Number: STEM-M-0121-LKN

Application: Accessories for AFM (Atomic Force Microscopes).

Model: HQ:NSC36/tipless/No Al

Description Specification Features Related Products

Description

MikroMasch Tipless AFM Probes are often used for custom applications such as for example attaching spheres or other objects for force spectroscopy measurements.

Specification

Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm

Related Products

Tipless AFM Probes, HQ:NSC36/tipless/Al BS, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0122-LKN)
Tipless AFM Probes, HQ:NSC36/tipless/Cr-Au, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0123-LKN)

Other recommended products

Highly Ordered Pyrolytic Graphite ZYA (HOPG, 0.4° Mosaic Spread), 10 x 10 x 1 mm, 1 chip, MikroMasch (CAT#: STEM-M-0156-LKN)
High Resolution AFM Probes, HI'RES-C15/CR-AU, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0067-LKN)
Conductive AFM Probes, HQ:DPE-XSC11, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0141-LKN)
Test Structures PA01/NM (AFM Tip Characterization Sample), MikroMasch (CAT#: STEM-M-0145-LKN)
Highly Ordered Pyrolytic Graphite ZYH (HOPG, 3.5° Mosaic Spread), 10 x 10 x 1 mm, 5 chip, MikroMasch (CAT#: STEM-M-0162-LKN)
Test Structures TGXYZ01/NM (20 nm Step Height XYZ Calibration Grating), MikroMasch (CAT#: STEM-M-0147-LKN)
General Purpose AFM Probes, HQ:NSC36/Al BS, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0114-LKN)
Long Scanning AFM Probes, HQ:NSC35/Hard/Al BS, 150 - 300 kHz (5.4 - 16 N/m), MikroMasch (CAT#: STEM-M-0108-LKN)