Conductive AFM Probes, HQ:DPE-XSC11, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0141-LKN)

MikroMasch Conductive AFM Probes are ideal for imaging of electric properties of materials in ambient conditions. Though silicon is conducting in bulk due to the presence of the dopants, the surface of the probe is always coated by a thin (1 - 2 nm) native oxide film. That is why using the conductivity of Si probes for AFM measurements is only possible in UHV conditions after the film is removed.

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 40 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Platinum
Detector coating: Platinum

Conductive AFM Probes, HQ:DPER-XSC11, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0142-LKN)
Long Scanning AFM Probes, HQ:DMD-XSC11, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0143-LKN)