Magnetic AFM Probes, HQ:NSC36/Co-Cr/Al BS, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0120-LKN)

MikroMasch Magnetic AFM Probes are used for mapping of magnetic stray field distribution over the surface of a sample in MFM. The probe is sharp enough to image magnetic domains on surface.

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 60 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Magnetic
Detector coating: Aluminum

Tipless AFM Probes, HQ:NSC36/tipless/No Al, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0121-LKN)
Tipless AFM Probes, HQ:NSC36/tipless/Al BS, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0122-LKN)