General Purpose AFM Probes, HQ:NSC36/No Al, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0115-LKN)

MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm

General Purpose AFM Probes, HQ:NSC36/Cr-Au BS, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0116-LKN)
Long Scanning AFM Probes, HQ:NSC36/Hard/Al BS, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0117-LKN)