Long Scanning AFM Probes, HQ:DMD-XSC11, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0143-LKN)

MikroMasch Long Scanning AFM Probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 250 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Conductive Diamond
Detector coating: Aluminum

General Purpose AFM Probes, HQ:NSC15/Al BS, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0068-LKN)
General Purpose AFM Probes, HQ:NSC15/No Al, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0069-LKN)