Tipless AFM Probes, HQ:CSC37/tipless/Cr-Au, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0130-LKN)

Cat Number: STEM-M-0130-LKN

Application: Accessories for AFM (Atomic Force Microscopes).

Model: HQ:CSC37/tipless/Cr-Au

Description Specification Features Related Products

Description

MikroMasch Tipless AFM Probes are often used for custom applications such as for example attaching spheres or other objects for force spectroscopy measurements.

Specification

Probe material: n-type silicon
Topside coating: Gold
Detector coating: Gold

Related Products

General Purpose AFM Probes, HQ:CSC38/No Al, 10 - 20 kHz (0.03 - 0.09 N/m), MikroMasch (CAT#: STEM-M-0131-LKN)
General Purpose AFM Probes, HQ:CSC38/Al BS, 10 - 20 kHz (0.03 - 0.09 N/m), MikroMasch (CAT#: STEM-M-0132-LKN)

Other recommended products

Conductive AFM Probes, HQ:NSC18/Pt, 75 kHz (2.8 N/m), MikroMasch (CAT#: STEM-M-0095-LKN)
Conductive AFM Probes, HQ:CSC37/Pt, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0127-LKN)
Test Structures TGX (Grating with Undercut-Edge Structures), MikroMasch (CAT#: STEM-M-0152-LKN)
General Purpose AFM Probes, HQ:CSC17/Cr-Au BS, 13 kHz (0.18 N/m), MikroMasch (CAT#: STEM-M-0099-LKN)
Test Structures TGXYZ01/NM (20 nm Step Height XYZ Calibration Grating), MikroMasch (CAT#: STEM-M-0147-LKN)
General Purpose AFM Probes, HQ:NSC14/Cr-Au BS, 160 kHz (5 N/m), MikroMasch (CAT#: STEM-M-0081-LKN)
Tipless AFM Probes, HQ:NSC36/tipless/Cr-Au, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0123-LKN)
General Purpose AFM Probes, HQ:NSC35/No Al, 150 - 300 kHz (5.4 - 16 N/m), MikroMasch (CAT#: STEM-M-0106-LKN)