NEX DE FAST SDD® EDXRF Spectrometer provides extensive element coverage through the easy-to-learn Windows-based QuantEZ software. Non-destructive analysis from sodium (Na) to uranium (U) in almost all matrices, from solids and alloys to powders, liquids and slurries.
Specification
Element Range:11Na to 92U Sample Type:Solids, Liquids, Alloys, Powders and Thin Films X-Ray Tube:60 kV X-ray Tube (max. 12 W) Detector(s):High performance FAST SDD detector, Peltier thermo-electric cooling Sample Chamber:Air, Helium, or Vacuum
Features
Powerful Windows-based QuantEZ software Solid, liquid, alloy, powder and film 60kV X-ray tube with wide element coverage FASTSDD® detector provides excellent counting statistics Multiple automatic tube filters increase sensitivity Unbeatable price-performance ratio Optional RPF-SQX basic parameter software Optional software without standard basic parameters