TriA SNOM Scanning Near Field Optical Microscope, A.P.E. Research (CAT#: STEM-M-0064-LKN)

A.P.E. Research TriA SNOM Scanning Near Field Optical Microscope combines the potentials of scanned probe technology with the power of optical microscopy. It brings a small optical probe very close to the sample surface, in the region called "near-field", and it allows the collection of optical signals providing image optical resolution below 100 nm.

TriA SNOM Scanning system:
Scanning stage with absolute positioning system and strain gauge sensors.

Standard scanner technical data:
X-Y scan size:
100 x 100 μm (high voltage mode)
10 x 10 μm (low voltage mode)
High voltage closed loop resolution: 2 nm
High voltage open loop resolution: 0.2 nm
Closed loop linearity: 0.1%

Z scan size:
10 μm (high voltage mode)
1 μm (low voltage mode)

Resolution: 0.16 nm (high voltage mode), 0.02 nm (low voltage mode).

Tools & Accessories:
TriA SNOM can be equipped with a large number of laser sources and filters

Integrated Double Optical Vision System for accurate positioning and far field optical investigation.
Compatible with a wide range of light microscope modes.
Separate or simultaneous transmission and reflection measurements.
Large Operation wavelength range.
Allows the light source set-up as top down or inverted.
Independent high-performance photo detectors for multiple optical signals collection.
Easily expandable.
Compatibility with third party scientific equipment.

pA-STM Scanning Tunneling Microscope, A.P.E. Research (CAT#: STEM-M-0061-LKN)
A100 AFM Atomic Force Microscopes, A.P.E. Research (CAT#: STEM-M-0062-LKN)
TriA SPM Scanning Probe Microscope, A.P.E. Research (CAT#: STEM-M-0063-LKN)
MountainsSPIP® - Analytical Software for Microscopy, A.P.E. Research (CAT#: STEM-M-0065-LKN)
APE Scanning Micro-Raman Integrated System, A.P.E. Research (CAT#: STEM-M-0066-LKN)