TriA SPM Scanning Probe Microscope, A.P.E. Research (CAT#: STEM-M-0063-LKN)

A.P.E. Research TriA SPM Scanning Probe Microscope is an innovative high resolution imaging and probing system. It is mainly dedicated for the studies of biomaterials (nucleic acids, peptides and proteins, cells and tissues, etc.) as well for thin films samples.

AFM Mode: supports major SPM scanning techniques: Contact AFM mode, Non-contact mode, Semi-contact mode, Phase Imaging, Lateral Force Microscopy, Force Curves Analysis, Electric properties, Magnetic Force Microscopy, etc.

TriA SPM Scanning system:
Scanning stage with absolute positioning system and strain gauge sensors.

Scanner technical data:
X-Y scan size:100 x 100μm (high voltage mode);
10 x 10 μm (low voltage mode)
High voltage mode closed loop resolution: 2 nm
High voltage mode open loop resolution: 0.2 nm
Closed loop linearity: 0.1%.

Z scan size:
10 μm (high voltage mode)
1 μm (low voltage mode)
Resolution: 0.16 nm (high voltage mode), 0.02 nm (low voltage mode)
Sample size: can accommodate samples with different geometries and sizes up to 30 mm diameter.

Accessories:
In order to provide different working modes A.P.E. Research have developed different dedicated tools (e.g. MFM Tool, EFM Tool, CAFM Tool, Liquid Cell, KFM Tool, Phase imaging, etc.).

Double optical sample observation (upright and inverted) for transparent and opaque samples.
Completely decoupled scanners for XY and Z configuration.
Large scanning ranges up to 250 μm.
Automatic tip sample approach.
High versatility for SPM and optical techniques.
Compatibility with third party scientific equipments.

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