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Routinely detect low traces of target compounds/chemicals in difficult matrices or relieve matrix pressure on the analytical system with the new Advanced Electron Ionization (AEI) source, available in dedicated configurations
Remove tuning complexity with SmartTune, a new simplified tuning tool
Boost instrument productivity to unprecedented levels with the patented NeverVent™ technology
Cat Number: STEM-MSPO-0025-ZJF
Application: For measuring the mass-to-charge ratio (m/z) of one or more molecules present in a sample