Aeris Research Benchtop X-Ray Diffractometer, Malvern Panalytical (CAT#: STEM-LE-0290-LC)

Highlights

Intuitive-place samples, select measurement procedures, receive results
First-class performance-excellent resolution and linearity ensures accurate and reliable phase analysis
Ideal teaching tool-you can teach the basics of powder diffraction visually using the optional 2D detector

Cat Number: STEM-LE-0290-LC

Application: Diffractometer

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Description

Aeris Research Benchtop X-Ray Diffractometer is easy-to-use, user-friendly and space-saving. The intuitive operation makes X-ray diffraction so simple that even inexperienced students can use it. The unique touch screen user interface allows you to easily carry out the sample measurement process.

Specification

X-Ray Tube: Empyrean X-ray tube, Cu
Detector(s): PIXcel 1D Detector; PIXcel3D Detector
Goniometer Type: DOPS2 goniometer with Heidenhain encoders

Features

Intuitive-place samples, select measurement procedures, receive results
First-class performance-excellent resolution and linearity ensures accurate and reliable phase analysis
Ideal teaching tool-you can teach the basics of powder diffraction visually using the optional 2D detector
Support measurement of phase change-through the optional non-environmental chamber, you can see how the phase composition changes with temperature

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